Available Equipement

SEM

Scanning Electron Microscope

Company: JEOL

Model: JSM6010PLUS/LA

Applications: Imaging, surface morphology, and elemental analysis

DSC

Differential Scanning Calorimetry

Company: NETZSCH

Model: STA 449 F5 Jupitar

Applications: Phase transition temperature, thermodynamic and kinetic properties

XRD

X-Ray Diffractometer

Company: Rigaku

Model: SmartLab

Applications: Identification of crystalline elements, compounds, phases and composition

TGA

Thermogravimetric Analysis

Company: NETZSCH

Model: STA 449 F5 Jupitar

Applications: Thermal Stability, decomposition/degradation temperatures, rate, and kinetcis

3 Flex Micromeretic Surface Analyzer

Company: Micromeretic

Applications: Surface are, absorption kinetics

TOC

Total Organic Carbon Analyzer

Company: Shimadzu

Model: TOC-L

Applications: Carbon content analysis, water quality